A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components

  1. Morilla, F.
  2. Vega, J.
  3. Dormido-Canto, S.
  4. Romero-Maestre, A.
  5. de-Martín-Hernández, J.
  6. Morilla, Y.
  7. Martín-Holgado, P.
  8. Domínguez, M.
Journal:
Sensors

ISSN: 1424-8220

Year of publication: 2024

Volume: 24

Issue: 13

Type: Article

DOI: 10.3390/S24134276 GOOGLE SCHOLAR lock_openOpen access editor