A Machine Learning Approach to Predict Radiation Effects in Microelectronic Components
- Morilla, F.
- Vega, J.
- Dormido-Canto, S.
- Romero-Maestre, A.
- de-Martín-Hernández, J.
- Morilla, Y.
- Martín-Holgado, P.
- Domínguez, M.
Journal:
Sensors
ISSN: 1424-8220
Year of publication: 2024
Volume: 24
Issue: 13
Type: Article