Die allocation optimization for yield improvement
- Ortega, C.
- Recio, M.
- Urquía, A.
- Sánchez, G.
- Nogal, U.
- Badillo, A.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Year of publication: 1997
Volume: 3216
Pages: 140-144
Type: Conference paper