Circuit Testing Based on Fuzzy Sampling with BDD Bases
- Pinilla, Elena
- Fernandez-Amoros, David
- Heradio, Ruben
Publisher: University of Hawaiʻi at Mānoa
ISBN: 978-0-9981331-6-4
Year of publication: 2023
Pages: 1551-1560
Type: Conference paper
Proceedings:
Proceedings of the 56th Hawaii International Conference on System Sciences
