Circuit Testing Based on Fuzzy Sampling with BDD Bases

  1. Sediles, E.P.
  2. Fernandez-Amoros, D.
  3. Heradio, R.
Proceedings:
Proceedings of the Annual Hawaii International Conference on System Sciences

ISSN: 1530-1605

ISBN: 9780998133164

Year of publication: 2023

Volume: 2023-January

Pages: 1551-1560

Type: Conference paper

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Data source: Scopus