Location of SVC based on voltage profiles and contingency analysis

  1. Jurado, Francisco
  2. Carpio, Jose
Journal:
Ciencia and Engenharia/ Science and Engineering Journal

ISSN: 0103-944X

Year of publication: 1999

Volume: 8

Issue: 2

Pages: 15-21

Type: Article

GOOGLE SCHOLAR
Data source: Scopus