Location of SVC based on voltage profiles and contingency analysis
- Jurado, Francisco
- Carpio, Jose
ISSN: 0103-944X
Argitalpen urtea: 1999
Alea: 8
Zenbakia: 2
Orrialdeak: 15-21
Mota: Artikulua
Aldizkaria:
Ciencia and Engenharia/ Science and Engineering Journal