Fractal characterization by frequency analysis: III. Effect of noise

  1. PANCORBO, M.
  2. ANGUIANO, E.
  3. AGUILAR, M.
Journal:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Year of publication: 1994

Volume: 176

Issue: 1

Pages: 54-62

Type: Review

DOI: 10.1111/J.1365-2818.1994.TB03499.X GOOGLE SCHOLAR
Data source: Scopus