Fractal characterization by frequency analysis. I. Surfaces

  1. ANGUIANO, E.
  2. PANCORBO, M.
  3. AGUILAR, M.
Journal:
Journal of Microscopy

ISSN: 1365-2818,  0022-2720

Year of publication: 1993

Volume: 172

Issue: 3

Pages: 223-232

Type: Article

DOI: 10.1111/J.1365-2818.1993.TB03416.X GOOGLE SCHOLAR
Data source: Scopus