Fractal characterization by frequency analysis. I. Surfaces
- ANGUIANO, E.
- PANCORBO, M.
- AGUILAR, M.
ISSN: 1365-2818, 0022-2720
Année de publication: 1993
Volumen: 172
Número: 3
Pages: 223-232
Type: Article
Revue:
Journal of Microscopy