Analysis of the bias induced by voxel and unstructured mesh Monte Carlo models for the MCNP6 code in orthovoltage applications

  1. Isolan, L.
  2. De Pietri, M.
  3. Iori, M.
  4. Botti, A.
  5. Cagni, E.
  6. Sumini, M.
Journal:
Radiation Effects and Defects in Solids

ISSN: 1029-4953 1042-0150

Year of publication: 2019

Volume: 174

Issue: 5-6

Pages: 365-379

Type: Article

DOI: 10.1080/10420150.2019.1596104 GOOGLE SCHOLAR

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