Universidad Autónoma de Madrid-ko ikertzaileekin lankidetzan egindako argitalpenak (11)

1994

  1. Fractal characterization by frequency analysis: III. Effect of noise

    Journal of Microscopy, Vol. 176, Núm. 1, pp. 54-62

  2. Noise characterization in scanning tunneling microscopy (STM)

    Pattern Recognition Letters, Vol. 15, Núm. 10, pp. 985-992

  3. Pitfalls in the fractal characterization of real microscopic surfaces by frequency analysis and proposal of a new method

    Publ by Elsevier Science Publishers B.V., pp. 37-46

1993

  1. Fractal characterization by frequency analysis. I. Surfaces

    Journal of Microscopy, Vol. 172, Núm. 3, pp. 223-232

  2. Fractal characterization by frequency analysis. II. A new method

    Journal of Microscopy, Vol. 172, Núm. 3, pp. 233-238

1992

  1. Digital filters to restore information from fast scanning tunnelling microscopy images

    Journal of Microscopy, Vol. 165, Núm. 2, pp. 311-324

  2. Study of the fractal character of surfaces by scanning tunnelling microscopy: Errors and limitations

    Journal of Microscopy, Vol. 167, Núm. 2, pp. 197-213

  3. Study of the surface roughness of Co-based amorphous alloys by STM

    Ultramicroscopy, Vol. 42-44, Núm. PART 2, pp. 1329-1336

1991

  1. Correlation between high field magnetization measurements and STM imaging of the atomic structure in amorphous Co100-xPx

    Journal of Magnetism and Magnetic Materials, Vol. 101, Núm. 1-3, pp. 199-201

  2. New filtering techniques to restore scanning tunneling microscopy images

    Surface Science, Vol. 251-252, Núm. C, pp. 418-423

1990

  1. A Wiener filter with circular-aperture-like point spread function to restore scanning tunneling microscopy (STM) images

    Pattern Recognition Letters, Vol. 11, Núm. 8, pp. 553-556